Dissertation
Hardened by design approaches for mitigating transient faults in memory-based systems
Washington State University
Doctor of Philosophy (PhD), Washington State University
05/2007
DOI:
https://doi.org/10.7273/000005592
Abstract
In radioactive environments, particle strikes can induce transient errors in integrated circuits (ICs). Strikes directly disrupting memory are known as Single-Event Upsets (SEUs), while strikes initially disrupting logic are called Single-Event Transients (SETs). Chips manufactured in aggressive technologies may also experience Multiple-Bit Upsets (MBUs). This research focuses on novel hardened by design circuit-level approaches to protecting integrated circuits against SEUs, SETs and MBUs. A number of system-level designs have been developed utilizing these approaches to demonstrate their capabilities. Many of the design-hardened memory circuits considered in this study share a common theme, which is the ability to bypass transient faults. This is critical for performance, as it allows a system to proceed with subsequent operations while recovering from a disruption. Among the considered approaches, the novel Triple Path DICE (TPDICE) structure is the most balanced. This structure requires only two of its three inputs to be resolved during a write operation to ensure recovery. The recovery process requires approximately 50-100ps in 0.18 m CMOS.
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Details
- Title
- Hardened by design approaches for mitigating transient faults in memory-based systems
- Creators
- Daniel Ryan Blum
- Contributors
- Jose G Delgado-Frias (Chair) - Washington State University, School of Electrical Engineering and Computer ScienceJabulani Nyathi (Committee Member)Partha Pratim Pande (Committee Member) - Washington State University, School of Electrical Engineering and Computer Science
- Awarding Institution
- Washington State University
- Academic Unit
- School of Electrical Engineering and Computer Science
- Theses and Dissertations
- Doctor of Philosophy (PhD), Washington State University
- Publisher
- Washington State University
- Number of pages
- 150
- Identifiers
- 99901054534701842
- Language
- English
- Resource Type
- Dissertation