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A power-delay evaluation of shorted, and independent, gate FinFET flip-flops under process variatons
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A power-delay evaluation of shorted, and independent, gate FinFET flip-flops under process variatons

Philip Maurice Munson
Washington State University
Master of Science (MS), Washington State University
2011
Handle:
https://hdl.handle.net/2376/105730
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P_Munson_1117111.63 MBDownloadView
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Abstract

Metal oxide semiconductors, Complementary.;Field-effect transistors.

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