Thesis
Defect characterization of yttrium orthovanadate
Master of Science (MS), Washington State University
2004
Handle:
https://hdl.handle.net/2376/175
Abstract
Single crystals of Nd:YVO4 grown with the Czochralski technique frequently exhibit light scattering defects that are detrimental to the laser and optical properties. Defects in the form of low angle grain boundaries have been characterized in what are nominally “single crystals” with polarized light microscopy, orientation imaging microscopy, and transmission electron microscopy. The misorientation angle of a low angle grain boundary was determined to be <1°, which corresponds to a formation energy of 1000-2000mJ/m2 . It was found that dislocations generated during crystal growth and cooling have enough mobility in certain growth directions to form low angle grain boundaries through polygonization. Several suggestions are made to reduce or eliminate polygonization, including the addition of a small amount of an atom with a size much larger or smaller than Y +3. Light scattering centers were examined with computed tomography and determined to be voids approximately 10µm in diameter.
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Details
- Title
- Defect characterization of yttrium orthovanadate
- Creators
- Joel Benjamin Lebret
- Contributors
- M. Grant Norton (Degree Supervisor)
- Awarding Institution
- Washington State University
- Academic Unit
- Mechanical and Materials Engineering, School of
- Theses and Dissertations
- Master of Science (MS), Washington State University
- Identifiers
- 99900525147701842
- Language
- English
- Resource Type
- Thesis