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Fabrication, characterization and modeling of honey and zirconium oxide based non-volatile resistive random access memory
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Fabrication, characterization and modeling of honey and zirconium oxide based non-volatile resistive random access memory

Aleksey Andrey Sivkov
Washington State University
Master of Science (MS), Washington State University
05/2021
DOI:
https://doi.org/10.7273/000004289
Handle:
https://hdl.handle.net/2376/118580
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Abstract

Thin films--Electric properties

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