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An improved deep submicrometer MOSFET RF nonlinear model with new breakdown current model and drain-to-substrate nonlinear coupling
Journal article

An improved deep submicrometer MOSFET RF nonlinear model with new breakdown current model and drain-to-substrate nonlinear coupling

Deuk Hyoun Heo, Edward Gebara, Yi-Jan Emery Chen, Seung-Yup Yoo, M Hamai, Youngsuk Suh and Joy Laskar
IEEE transactions on microwave theory and techniques, Vol.48(12), pp.2361-2369
12/2000
Handle:
https://hdl.handle.net/2376/116523

Abstract

Radio frequency Breakdown voltage Power measurement Pulse measurements Electric breakdown RF signals Coupling circuits MOSFET circuits Robustness Distortion measurement

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