Journal article
Angle-resolving time-of-flight electron spectrometer for near-threshold precision measurements of differential cross sections of electron-impact excitation of atoms and molecules
Review of Scientific Instruments, Vol.79(4)
2008
Abstract
This article presents a new type of low-energy crossed-beam electron spectrometer for measuring angular differential cross sections of electron-impact excitation of atomic and molecular targets. Designed for investigations at energies close to excitation thresholds, the spectrometer combines a pulsed electron beam with the time-of-flight technique to distinguish between scattering channels. A large-area, position-sensitive detector is used to offset the low average scattering rate resulting from the pulsing duty cycle, without sacrificing angular resolution. A total energy resolution better than 150meV (full width at half maximum) at scattered energies of 0.5–3eV is achieved by monochromating the electron beam prior to pulsing it. The results of a precision measurement of the differential cross section for electron-impact excitation of helium, at an energy of 22eV, are used to assess the sensitivity and resolution of the spectrometer.
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Details
- Title
- Angle-resolving time-of-flight electron spectrometer for near-threshold precision measurements of differential cross sections of electron-impact excitation of atoms and molecules
- Creators
- M LangeJ MatsumotoA SetiawanR PanajotovicJ HarrisonJCA LowerD S NewmanS MondalS J Buckman
- Publication Details
- Review of Scientific Instruments, Vol.79(4)
- Academic Unit
- Environment, School of the (CAS)
- Publisher
- American Institute of Physics
- Identifiers
- 99900669311201842
- Resource Type
- Journal article