Characterization of a vertically aligned silica nanospring-based sensor by alternating current impedance spectroscopy

Yukta P TIMALSINA; Dennis ORIERO; Giancarlo CORTI; Timothy CANTRELL; Tej PRAKASH; Joshua BRAZEN; D. Eric ASTON; Kenneth NOREN; James J NAGLER; Shiva RASTOGI; David N MCILROY

doi:10.1088/0960-1317/20/9/095005

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Characterization of a vertically aligned silica nanospring-based sensor by alternating current impedance spectroscopy

Journal article

Peer reviewed

Characterization of a vertically aligned silica nanospring-based sensor by alternating current impedance spectroscopy

Yukta P TIMALSINA, Dennis ORIERO, Giancarlo CORTI, Timothy CANTRELL, Tej PRAKASH, Joshua BRAZEN, D. Eric ASTON, Kenneth NOREN, James J NAGLER, Shiva RASTOGI, …

Journal of micromechanics and microengineering, Vol.20(9), p.095005

2010

DOI: https://doi.org/10.1088/0960-1317/20/9/095005

Handle:

https://hdl.handle.net/2376/117293

Abstract

Micromechanical devices and systems

Mechanical instruments, equipment and techniques

Mechanical engineering. Machine design

Exact sciences and technology

Microelectronic fabrication (materials and surfaces technology)

Instruments, apparatus, components and techniques common to several branches of physics and astronomy

Electronics

General

Applied sciences

Precision engineering, watch making

Physics

Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices

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Title: Characterization of a vertically aligned silica nanospring-based sensor by alternating current impedance spectroscopy
Creators: Yukta P TIMALSINA - Department of Physics, University of Idaho, Moscow, ID 83844, United States
Dennis ORIERO - Department of Chemical and Materials Engineering, University of Idaho, Moscow, ID 83844, United States
Giancarlo CORTI - Department of Physics, University of Idaho, Moscow, ID 83844, United States
Timothy CANTRELL - GoNano Technologies Inc., Moscow, ID 83843, United States
Tej PRAKASH - GoNano Technologies Inc., Moscow, ID 83843, United States
Joshua BRAZEN - Department of Physics, University of Idaho, Moscow, ID 83844, United States
D. Eric ASTON - Department of Chemical and Materials Engineering, University of Idaho, Moscow, ID 83844, United States
Kenneth NOREN - Department of Electrical and Computer Engineering, University of Idaho, Moscow, ID 83844, United States
James J NAGLER - Department of Biological Sciences, University of Idaho, Moscow, ID 83844, United States
Shiva RASTOGI - BANL, University of Idaho, Coeur dÁlene, ID 83814, United States
David N MCILROY - Department of Physics, University of Idaho, Moscow, ID 83844, United States
Publication Details: Journal of micromechanics and microengineering, Vol.20(9), p.095005
Publisher: Institute of Physics; Bristol
Identifiers: 99900548453501842
Language: English
Resource Type: Journal article

Characterization of a vertically aligned silica nanospring-based sensor by alternating current impedance spectroscopy

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