Correlation between surface whisker growth and interfacial precipitation in aluminum thin films on silicon substrates

Journal article

Peer reviewed

I Dutta, M Burkhard, S Kuwano, T Fujita and M. W Chen

Journal of materials science, Vol.45(12), pp.3367-3374

06/2010

Handle:

https://hdl.handle.net/2376/113868

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Title: Correlation between surface whisker growth and interfacial precipitation in aluminum thin films on silicon substrates
Creators: I Dutta
M Burkhard
S Kuwano
T Fujita
M. W Chen
Publication Details: Journal of materials science, Vol.45(12), pp.3367-3374
Academic Unit: Mechanical and Materials Engineering, School of
Identifiers: 99900547948801842
Language: English
Resource Type: Journal article