Journal article
Development, Validation, and Re-selection of Wheat Lines with Pyramided Genes Yr64 and Yr15 Linked on the Short Arm of Chromosome 1B for Resistance to Stripe Rust
Plant disease, Vol.103(1), pp.51-58
01/2019
Handle:
https://hdl.handle.net/2376/110305
PMID: 30387683
Abstract
Stripe rust, caused by Puccinia striiformis f. sp. tritici (Pst), is one of the most destructive diseases of wheat worldwide. The disease is most preferably managed by developing and growing cultivars with high-level, durable resistance. To achieve high-level and long-lasting resistance, we developed a wheat line, RIL-Yr64/Yr15, by pyramiding Yr64 and Yr15, both on the chromosome 1BS and providing high resistance to all tested Pst races. To validate RIL-Yr64/Yr15 possessing both genes, we crossed it to Avocet S (AvS). The F4 RILs from this cross were phenotyped with Pst races under controlled greenhouse conditions and also under natural Pst infection in the field. The population was genotyped with SSR markers previously reported to be linked to the resistance gene loci and with additional SSR and SNP-KASP markers along chromosome 1B. Both phenotype and genotype data confirmed the copresence of Yr64 and Yr15 in RIL-Yr64/Yr15, and the high-resolution linkage map dissected the chromosomal regions and traced their origins. New lines possessing these genes were selected from the F5 population of cross AvS × RIL-Yr64/Yr15 by marker-assisted selection. These lines with the two highly effective genes should be more useful than individual gene lines for developing high-level, durable resistant wheat cultivars.
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Details
- Title
- Development, Validation, and Re-selection of Wheat Lines with Pyramided Genes Yr64 and Yr15 Linked on the Short Arm of Chromosome 1B for Resistance to Stripe Rust
- Creators
- Yanmin Qie - Center for Agricultural Resources Research, Institute of Genetics and Developmental Biology, Chinese Academy of Sciences, Shijiazhuang, Hebei 050021; University of Chinese Academy of Sciences, Beijing, 100049, China; and Department of Plant Pathology, Washington State University, Pullman, WA 99164-6430Yan Liu - Department of Plant Pathology, Washington State University, Pullman, WA 99164-6430Meinan Wang - Department of Plant Pathology, Washington State University, Pullman, WA 99164-6430Xing Li - College of Plant Protection, Hebei Agricultural University, Baoding, Hebei 071001, China and Department of Plant Pathology, Washington State University, Pullman, WADeven R See - USDA-ARS, Wheat Health, Genetics, and Quality Research Unit, Pullman, WA 99164-6430Diaoguo An - Center for Agricultural Resources Research, Institute of Genetics and Developmental Biology, Chinese Academy of Sciences, Shijiazhuang, Hebei 050021, ChinaXianming Chen - USDA-ARS, Wheat Health, Genetics, and Quality Research Unit, Pullman, WA 99164-6430
- Publication Details
- Plant disease, Vol.103(1), pp.51-58
- Academic Unit
- Plant Pathology, Department of
- Identifiers
- 99900547165201842
- Language
- English
- Resource Type
- Journal article