Effects of relative humidity and applied force on atomic force microscopy images of the filamentous phage fd

Journal article

Peer reviewed

XIAOLONG XIAOLONG JI, JEONG JEONG OH, A. K DUNKER and K. W HIPPS

Ultramicroscopy, Vol.72(3-4), pp.165-176

1998

Handle:

https://hdl.handle.net/2376/109703

PMID: 9639940

Abstract

Fundamental and applied biological sciences. Psychology

Scanning tunneling and atomic force microscopy

Scanning probe microscopes, components and techniques

Atomic force microscopes

Exact sciences and technology

Instruments, apparatus, components and techniques common to several branches of physics and astronomy

General

Biological and medical sciences

Diverse techniques

Molecular and cellular biology

Physics

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Title: Effects of relative humidity and applied force on atomic force microscopy images of the filamentous phage fd
Creators: XIAOLONG XIAOLONG JI - Departments of Chemistry and Biochemistry, Washington State University, Pullman, WA 99164-4630, United States
JEONG JEONG OH - Departments of Chemistry and Biochemistry, Washington State University, Pullman, WA 99164-4630, United States
A. K DUNKER - Departments of Chemistry and Biochemistry, Washington State University, Pullman, WA 99164-4630, United States
K. W HIPPS - Departments of Chemistry and Biochemistry, Washington State University, Pullman, WA 99164-4630, United States
Publication Details: Ultramicroscopy, Vol.72(3-4), pp.165-176
Academic Unit: Chemistry, Department of
Publisher: Elsevier Science; Amsterdam
Identifiers: 99900547796001842
Language: English
Resource Type: Journal article