Journal article
Examination of crystal defects with high-kV X-ray computed tomography
Materials letters, Vol.59(10), pp.1113-1116
2005
Handle:
https://hdl.handle.net/2376/115044
Abstract
High resolution X-ray computed tomography (CT) is shown to be a useful technique for characterizing the defect known as scatter in Nd-doped yttrium orthovanadate (Nd:YVO
4) single crystals. Scatter is identified by a dense cloud or rings of defects, which cause crystal inhomogeneity. Computed tomography indicated that the scattering sites were regions of low density. This result rules out micropieces of iridium and the segregation phases of V
2O
5 and Y
2O
3 as the main scattering centers. Transmission electron microscopy has shown, however, that inclusions are nonetheless present in regions of the crystal containing scatter. The major scattering defect in the crystal was determined to be microvoids which are approximately 10 μm in diameter.
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Details
- Title
- Examination of crystal defects with high-kV X-ray computed tomography
- Creators
- J.B LeBretM.G NortonD.F Bahr
- Publication Details
- Materials letters, Vol.59(10), pp.1113-1116
- Academic Unit
- Mechanical and Materials Engineering, School of
- Publisher
- Elsevier B.V
- Identifiers
- 99900547543001842
- Language
- English
- Resource Type
- Journal article