Majority multiplexing- : Economical redundant fault-tolerant designs for nanoarchitectures

Journal article

Sandip ROY and Valeriu BEIU

IEEE transactions on nanotechnology, Vol.4(4), pp.441-451

2005

Handle:

https://hdl.handle.net/2376/113811

Abstract

Integrated circuits

Molecular electronics, nanoelectronics

Exact sciences and technology

Electronics

Applied sciences

Design. Technologies. Operation analysis. Testing

Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices

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Title: Majority multiplexing- : Economical redundant fault-tolerant designs for nanoarchitectures
Creators: Sandip ROY - School of Electrical Engineering and Computer Science, Washington State University, Pullman, WA 99164-2752, United States
Valeriu BEIU - College of Information Technology, United Arab Emirates University, Al-Ain, United Arab Emirates
Publication Details: IEEE transactions on nanotechnology, Vol.4(4), pp.441-451
Academic Unit: Electrical Engineering and Computer Science, School of
Publisher: Institute of Electrical and Electronics Engineers; New York, NY
Identifiers: 99900548262401842
Language: English
Resource Type: Journal article