Journal article
Mapping a Large Number of QTL for Durable Resistance to Stripe Rust in Winter Wheat Druchamp Using SSR and SNP Markers
PloS one, Vol.10(5), pp.e0126794-e0126794
2015
Handle:
https://hdl.handle.net/2376/101142
PMCID: PMC4430513
PMID: 25970329
Abstract
Winter wheat Druchamp has both high-temperature adult-plant (HTAP) resistance and all-stage resistance to stripe rust caused by Puccinia striiformis f. sp. tritici (Pst). The HTAP resistance in Druchamp is durable as the variety has been resistant in adult-plant stage since it was introduced from France to the United States in late 1940s. To map the quantitative trait loci (QTL) for stripe rust resistance, an F8 recombinant inbred line (RIL) population from cross Druchamp × Michigan Amber was phenotyped for stripe rust response in multiple years in fields under natural infection and with selected Pst races under controlled greenhouse conditions, and genotyped with simple sequence repeat (SSR) and single nucleotide polymorphism (SNP) markers. Composite interval mapping (CIM) identified eight HTAP resistance QTL and three all-stage resistance QTL. Among the eight HTAP resistance QTL, QYrdr.wgp-1BL.2 (explaining 2.36-31.04% variation), QYrdr.wgp-2BL (2.81-15.65%), QYrdr.wgp-5AL (2.27-17.22%) and QYrdr.wgp-5BL.2 (2.42-15.13%) were significant in all tests; and QYrdr.wgp-1BL.1 (1.94-10.19%), QYrdr.wgp-1DS (2.04-27.24%), QYrdr.wgp-3AL (1.78-13.85%) and QYrdr.wgp-6BL.2 (1.69-33.71%) were significant in some of the tests. The three all-stage resistance QTL, QYrdr.wgp-5BL.1 (5.47-36.04%), QYrdr.wgp-5DL (9.27-11.94%) and QYrdr.wgp-6BL.1 (13.07-20.36%), were detected based on reactions in the seedlings tested with certain Pst races. Among the eleven QTL detected in Druchamp, at least three (QYrdr.wgp-5DL for race-specific all-stage resistance and QYrdr.wgp-3AL and QYrdr.wgp-6BL.2 for race non-specific HTAP resistance) are new. All these QTL, especially those for durable HTAP resistance, and their closely linked molecular markers could be useful for developing wheat cultivars with durable resistance to stripe rust.
Metrics
10 Record Views
Details
- Title
- Mapping a Large Number of QTL for Durable Resistance to Stripe Rust in Winter Wheat Druchamp Using SSR and SNP Markers
- Creators
- Lu Hou - Key Laboratory of Agricultural Integrated Pest Management, Institute of Plant Protection, Qinghai Academy of Agriculture and Forestry Sciences, Xining, Qinghai, China; Department of Plant Pathology, Washington State University, Pullman, Washington, United States of America; State Key Laboratory of Crop Stress Biology in Arid Areas and College of Plant Protection, Northwest A&F University, Yangling, Shaanxi, ChinaXianming Chen - Department of Plant Pathology, Washington State University, Pullman, Washington, United States of America; US Department of Agriculture, Agricultural Research Service, Wheat Genetics, Quality, Physiology and Disease Research Unit, Pullman, Washington, United States of AmericaMeinan Wang - Department of Plant Pathology, Washington State University, Pullman, Washington, United States of AmericaDeven R See - Department of Plant Pathology, Washington State University, Pullman, Washington, United States of America; US Department of Agriculture, Agricultural Research Service, Wheat Genetics, Quality, Physiology and Disease Research Unit, Pullman, Washington, United States of AmericaShiaoman Chao - US Department of Agriculture, Agricultural Research Service, Cereal Crops Research, Fargo, North Dakota, United States of AmericaPeter Bulli - Department of Crop and Soil Sciences, Washington State University, Pullman, Washington, United States of AmericaJinxue Jing - State Key Laboratory of Crop Stress Biology in Arid Areas and College of Plant Protection, Northwest A&F University, Yangling, Shaanxi, China
- Publication Details
- PloS one, Vol.10(5), pp.e0126794-e0126794
- Academic Unit
- Plant Pathology, Department of
- Publisher
- United States
- Identifiers
- 99900546664401842
- Language
- English
- Resource Type
- Journal article