- Title
- Probing Liquid Surfaces and Interfaces Using Time-of-Flight Secondary Ion Mass Spectrometry
- Creators
- Xiao-Ying Yu - Atmospheric Sciences and Global Climate Change Division, Pacific Northwest National Laboratory, Richland, WA 99354, USAZihua Zhu - W. R & Wiley Environmental Molecular Science Laboratory, Pacific Northwest National Laboratory,Richland, WA 99354, USABingwen Liu - Atmospheric Sciences and Global Climate Change Division, Pacific Northwest National Laboratory, Richland, WA 99354, USAMatthew Marshall - Biological Sciences Division, Pacific Northwest National Laboratory, Richland, WA 99352, USAXin Hua - Atmospheric Sciences and Global Climate Change Division, Pacific Northwest National Laboratory, Richland, WA 99354, USAZhaoying Wang - W. R & Wiley Environmental Molecular Science Laboratory, Pacific Northwest National Laboratory,Richland, WA 99354, USALi Yang - W. R & Wiley Environmental Molecular Science Laboratory, Pacific Northwest National Laboratory,Richland, WA 99354, USAAbigail Tucker - Biological Sciences Division, Pacific Northwest National Laboratory, Richland, WA 99352, USAWilliam Chrisler - Biological Sciences Division, Pacific Northwest National Laboratory, Richland, WA 99352, USAEric Hill - Biological Sciences Division, Pacific Northwest National Laboratory, Richland, WA 99352, USAEugene Rodek - SPI Supplies/Structure Probe, Inc., West Chester, PA 19380, USATheva Thevuthasan - W. R & Wiley Environmental Molecular Science Laboratory, Pacific Northwest National Laboratory,Richland, WA 99354, USAYuehe Lin - School of Mechanical and Materials Engineering, Washington State University, WA, 99164, USAJames Cowin - Chemical and Materials Sciences Division, Pacific Northwest National Laboratory, Richland, WA 99354, USA
- Publication Details
- Microscopy and microanalysis, Vol.20(S3), pp.2048-2049
- Academic Unit
- Mechanical and Materials Engineering, School of
- Publisher
- Cambridge University Press; New York, USA
- Number of pages
- 2
- Identifiers
- 99900547520501842
- Language
- English
- Resource Type
- Journal article
Journal article
Probing Liquid Surfaces and Interfaces Using Time-of-Flight Secondary Ion Mass Spectrometry
Microscopy and microanalysis, Vol.20(S3), pp.2048-2049
08/2014
Handle:
https://hdl.handle.net/2376/116767
Abstract
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