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Towards an integrated materials characterization toolbox
Journal article   Peer reviewed

Towards an integrated materials characterization toolbox

Ian M Robertson, Christopher A Schuh, John S Vetrano, Nigel D Browning, David P Field, Dorte Juul Jensen, Michael K Miller, Ian Baker, David C Dunand, Rafal Dunin-Borkowski, …
Journal of materials research, Vol.26(11), pp.1341-1383
06/14/2011
Handle:
https://hdl.handle.net/2376/108743

Abstract

X-ray tomography Scanning electron microscopy (SEM) Transmission electron microscopy (TEM)

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