Journal article
What is measured in the scanning gate microscopy of a quantum point contact?
Physical review letters, Vol.105(16), pp.166802-166802
10/15/2010
Handle:
https://hdl.handle.net/2376/106992
PMID: 21230993
Abstract
The conductance change due to a local perturbation in a phase-coherent nanostructure is calculated. The general expressions to first and second order in the perturbation are applied to the scanning gate microscopy of a two-dimensional electron gas containing a quantum point contact. The first-order correction depends on two scattering states with electrons incoming from opposite leads and is suppressed on a conductance plateau; it is significant in the step regions. On the plateaus, the dominant second-order term likewise depends on scattering states incoming from both sides. It is always negative, exhibits fringes, and has a spatial decay consistent with experiments.
Metrics
17 Record Views
Details
- Title
- What is measured in the scanning gate microscopy of a quantum point contact?
- Creators
- Rodolfo A Jalabert - Institut de Physique et Chimie des Matériaux de StrasbourgWojciech Szewc - Institut de Physique et Chimie des Matériaux de StrasbourgSteven Tomsovic - Department of PhysicsDietmar Weinmann - Institut de Physique et Chimie des Matériaux de Strasbourg
- Publication Details
- Physical review letters, Vol.105(16), pp.166802-166802
- Academic Unit
- Physics and Astronomy, Department of
- Publisher
- American Physical Society
- Identifiers
- 99900546623901842
- Language
- English
- Resource Type
- Journal article